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DOI | 10.1002/2017GL074663 |
Nanoscale Roughness of Natural Fault Surfaces Controlled by Scale-Dependent Yield Strength | |
Thom, C. A.1; Brodsky, E. E.2; Carpick, R. W.3; Pharr, G. M.4; Oliver, W. C.5; Goldsby, D. L.1 | |
2017-09-28 | |
发表期刊 | GEOPHYSICAL RESEARCH LETTERS |
ISSN | 0094-8276 |
EISSN | 1944-8007 |
出版年 | 2017 |
卷号 | 44期号:18 |
文章类型 | Article |
语种 | 英语 |
国家 | USA |
英文摘要 | Many natural fault surfaces exhibit remarkably similar scale-dependent roughness, which may reflect the scale-dependent yield strength of rocks. Using atomic force microscopy (AFM), we show that a sample of the Corona Heights Fault exhibits isotropic surface roughness well-described by a power law, with a Hurst exponent of 0.75 +/- 0.05 at all wavelengths from 60 nm to 10 m. The roughness data and a recently proposed theoretical framework predict that yield strength varies with length scale as lambda(-0.25+/-0.05). Nanoindentation tests on the Corona Heights sample and another fault sample whose topography was previously measured with AFM (the Yair Fault) reveal a scale-dependent yield stress with power-law exponents of -0.12 +/- 0.06 and -0.18 +/- 0.08, respectively. These values are within one to two standard deviations of the predicted value, and provide experimental evidence that fault roughness is controlled by intrinsic material properties, which produces a characteristic surface geometry. |
英文关键词 | fault roughness nanoindentation atomic force microscopy yield strength |
领域 | 气候变化 |
收录类别 | SCI-E |
WOS记录号 | WOS:000413148100023 |
WOS关键词 | INDENTATION EXPERIMENTS ; CONTACT MECHANICS ; FRACTURE SURFACES ; ELASTIC-MODULUS ; SIZE ; SLIP ; HARDNESS ; NANOINDENTATION ; PLASTICITY ; FRICTION |
WOS类目 | Geosciences, Multidisciplinary |
WOS研究方向 | Geology |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://119.78.100.173/C666/handle/2XK7JSWQ/28546 |
专题 | 气候变化 |
作者单位 | 1.Univ Penn, Dept Earth & Environm Sci, Philadelphia, PA 19104 USA; 2.Univ Calif Santa Cruz, Dept Earth & Planetary Sci, Santa Cruz, CA 95064 USA; 3.Univ Penn, Dept Mech Engn & Appl Mech, Philadelphia, PA 19104 USA; 4.Texas A&M Univ, Dept Mat Sci & Engn, College Stn, TX USA; 5.Nanomech Inc, Oak Ridge, TN USA |
推荐引用方式 GB/T 7714 | Thom, C. A.,Brodsky, E. E.,Carpick, R. W.,et al. Nanoscale Roughness of Natural Fault Surfaces Controlled by Scale-Dependent Yield Strength[J]. GEOPHYSICAL RESEARCH LETTERS,2017,44(18). |
APA | Thom, C. A.,Brodsky, E. E.,Carpick, R. W.,Pharr, G. M.,Oliver, W. C.,&Goldsby, D. L..(2017).Nanoscale Roughness of Natural Fault Surfaces Controlled by Scale-Dependent Yield Strength.GEOPHYSICAL RESEARCH LETTERS,44(18). |
MLA | Thom, C. A.,et al."Nanoscale Roughness of Natural Fault Surfaces Controlled by Scale-Dependent Yield Strength".GEOPHYSICAL RESEARCH LETTERS 44.18(2017). |
条目包含的文件 | 条目无相关文件。 |
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